Course overview
This course will introduce fundamental technological principles and applications of advanced characterisation techniques (e.g. TEM, SEM, AFM, STM, XPS, Raman, UV-visible-NIR, FTIR, photoluminescence) used to establish the physical and chemical properties of materials at the nanoscale.
Course learning outcomes
- Understand and discuss the basic principles of advanced characterisation techniques (e.g. electronic microscopy, atomic force microscopy, Raman)
- Explain and correlate the structure-property of materials at the nanoscale by different characterisation techniques
- Define the basic properties and characteristics of materials by analysing their properties through a set of characterisation techniques
- Discuss the basic principles of advanced characterisation techniques
- Apply and select appropriate techniques for characterising specific chemical and physical properties of materials